ACCURATE VERIFY APPARATUS AND METHOD FOR NOR FLASH MEMORY CELLS IN THE PRESENCE OF HIGH COLUMN LEAKAGE

摘要

A technique is provided for reducing column leakage in a flash EEPROM device (10) during an erase verification process, thereby preventing false verifies. The technique has application in NOR arrays or other types of arrays in which a number of cells (100) are connected in parallel. The technique operates by reducing the leakage of the unselected cells in parallel to the selected cell being verified, thereby preventing false verifies. The technique can also be used in conjunction with other techniques for reducing column leakage, such as soft programming, automatic programming disturb erase (APDE), or various other Vth compacting schemes.