发明名称 |
A system and process for analysing surface defects |
摘要 |
The system may be used for three-dimensional analysis of surface defects and microdefects performed by correlating two images of the surface according to the general criteria of stereoscopic vision. The system may be implemented by integrating, in a single monolithic component made using VLSI CMOS technology, an optical sensor with a cellular neural network comprising a matrix of cells configured as analog processors. <IMAGE> |
申请公布号 |
EP1255224(A1) |
申请公布日期 |
2002.11.06 |
申请号 |
EP20010830289 |
申请日期 |
2001.05.02 |
申请人 |
STMICROELECTRONICS S.R.L. |
发明人 |
SPOTO, GIUSEPPE;BRANCIFORTE, MARCO;DODDO, FRANCESCO;OCCHIPINTI, LUIGI |
分类号 |
G01N21/88;G06T7/00;H04N13/00 |
主分类号 |
G01N21/88 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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