| 摘要 |
PROBLEM TO BE SOLVED: To provide a circuit device which can test many integrated circuits concurrently, and at the same time has a low-cost structure. SOLUTION: The circuit device is provided at least a control means for generating from an external modulation signal and an external clock signal, a first modulation signal, a second modulation signal shifted in time to the first modulation signal, a symmetric first clock signal, and a symmetric second clock signal reversed to the first clock signal, a first driver means 40 connected to a first supply voltage modulated in the amplitude by the first modulation signal and to a first reference potential, and a second driver means 50 connected to a second supply voltage modulated in the amplitude by the second modulation signal and to a second reference potential.
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