| 摘要 |
<p>The invention concerns a method for detecting the transformation of a substrate (S) into a product (P), characterised in that it consists in measuring the pM modification resulting from the difference of the chelating power of the substrate (S) and of the product (P) relative to a metal ion. Advantageously, the detection is carried out by measuring the modification of the spectral properties of a chemical detector (L), chelating agent for a metal ion, resulting from the metal ion exchanges between the product (P) and the chemical detector (L), when the product (P) has a chelating power higher than that of the substrate (S), or between the substrate (S) and the chemical detector (L), when the substrate (S) has a chelating power higher than that of the product (P).</p> |
