METHOD FOR TESTING SEMICONDUCTOR MEMORY MODULES

摘要

PURPOSE: A method for testing semiconductor memory modules is provided, which certainly is operated and favorably uses channel bandwidth by using test channel as small as possible. CONSTITUTION: A method for testing semiconductor memory modules comprising: storing data in a memory bank having an addressable matrix structure containing rows and columns; subdividing elements selected from the group consisting of the rows and the columns into regions; counting defect locations occurring in each one of the regions in a manner selected from the group consisting of a row by row manner and a column by column manner; obtaining comparison results by comparing a number of the defect locations in each one of the regions with a threshold value in a manner selected from the group consisting of a row by row manner and a column by column manner; and transmitting the comparison results as additional information in a manner selected from the group consisting of a row by row manner and a column by column manner to an external test device, and transmitting the comparison results to the external test device together with defect addresses of defect locations in the memory bank.