发明名称 INDEX HEAD OF SEMICONDUCTOR ELEMENT TEST HANDLER
摘要 PROBLEM TO BE SOLVED: To provide an index head of a semiconductor element test handler which quickly controls the pressing force and the temperature of a semiconductor element to smoothly position and arrange it, thereby quickly performing the index operation. SOLUTION: The index head of a semiconductor element test handler comprises a carrier base 10 fixed to a carrier, an elevator carrier 20 vertically movably mounted on the carrier base, a head holder 30 coupled with the elevator carrier bottom movably relative to the elevator carrier and a plurality of heads 40 each having a holder 41 for sucking and holding a semiconductor element, a heater 42 for directly transferring heat to the semiconductor element, and a compliance unit 43 having a degree of freedom for arranging between the semiconductor element and testing sockets.
申请公布号 JP2002303650(A) 申请公布日期 2002.10.18
申请号 JP20020002402 申请日期 2002.01.09
申请人 MIRE KK 发明人 HWANG HYUN JOO
分类号 G01R31/26;G01R1/073;G01R31/01;(IPC1-7):G01R31/26 主分类号 G01R31/26
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