发明名称 METHOD FOR SELECTING FROM A STANDARDIZED SET OF INTEGRATED CIRCUIT MASK FEATURES
摘要 <p>Methods and apparatus for manufacturing a semi-custom integrated circuit by using a standard mask (figure 3, 312) and a custom mask (figure 3, 300) to select from a standardized set of features in a way that obviates the need to create a customized mask containing only the selected features (figure 3, 316), and mask sets created using such methods and apparatus. For some integrated circuit fabrication processes, the second mask has an additional purpose, so it is not created only to perform this selection function. For some fabrication processes, the selection can be achieved without use of additional processing steps.</p>
申请公布号 WO2002082564(A2) 申请公布日期 2002.10.17
申请号 US2002010589 申请日期 2002.04.04
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