| 发明名称 |
Measuring a material property of an electrically conductive object |
| 摘要 |
The present invention relates to a device for measuring the value of a parameter relating to an electrically conductive object. Such a parameter can be the electric conductivity or the degree in which the material has changed under the influence of external conditions. Alternatively the parameter is the quality of a weld or the thickness of the object.
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| 申请公布号 |
US2002149361(A1) |
申请公布日期 |
2002.10.17 |
| 申请号 |
US20010028843 |
申请日期 |
2001.12.20 |
| 申请人 |
KRONEMEIJER DIRK ARIE;VAN DE LOO PETRUS JOHANNES;LOOIJER MARK THEODOOR;MEYER RICKY EDUARDO RICARDO |
发明人 |
KRONEMEIJER DIRK ARIE;VAN DE LOO PETRUS JOHANNES;LOOIJER MARK THEODOOR;MEYER RICKY EDUARDO RICARDO |
| 分类号 |
G01N27/72;G01N1/00;G01N27/04;G01N27/90;G01R33/12;(IPC1-7):G01N27/72 |
主分类号 |
G01N27/72 |
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