发明名称 Automatisches Analysegerät
摘要 A sample of a sample rack is sampled at analyzing units in the middle of a transfer line. A standby unit and a rack collecting unit are arranged near an exit of the transfer line. Sample racks after sampled are sorted out to the standby unit or the rack collecting unit at a first switching unit. The racks contained in the standby unit are sorted out to a returning line or the rack collecting unit in a second switching unit corresponding to a judged result of whether or not reexamination is required. <IMAGE>
申请公布号 DE69807539(D1) 申请公布日期 2002.10.10
申请号 DE1998607539 申请日期 1998.01.20
申请人 HITACHI, LTD. 发明人 HANAWA, MASAAKI;MITSUMAKI, HIROSHI;OHISHI, TADASHI;KAI, SUSUMU;WATANABE, HIROSHI
分类号 G01N35/00;G01N35/02;G01N35/04;(IPC1-7):G01N35/04 主分类号 G01N35/00
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