发明名称 |
Process for etching phase shift layers in half-tone phase masks used in the production of microchips comprises depositing a phase shift layer on a substrate, applying a mask, and plasma |
摘要 |
Process for etching phase shift layers in half-tone phase masks comprises depositing a phase shift layer on a substrate; applying a mask on the phase shift layer; and plasma etching the structure produced into the phase shift layer. Plasma etching is carried out in an etching reactor with a plasma produced from a fluorinated hydrocarbon having a ratio of F/H of not more than 2 and oxygen. Preferred Features: The fluorinated hydrocarbon is CH3F. The cathode power of the reactor is more than 20 W to etch the structure into the phase shift reactor. The phase shift layer is made from molybdenum/silicon nitride. The substrate is made from quartz glass. The mask is a chromium mask.
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申请公布号 |
DE10126575(C1) |
申请公布日期 |
2002.10.10 |
申请号 |
DE20011026575 |
申请日期 |
2001.05.31 |
申请人 |
INFINEON TECHNOLOGIES AG;APPLIED MATERIALS GMBH |
发明人 |
RUHL, GUENTHER;FALK, NORBERT |
分类号 |
G03F1/00;H01L21/3213;(IPC1-7):G03F1/14;C23F4/00 |
主分类号 |
G03F1/00 |
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