发明名称 |
Dielectric layer recovery method for integrated circuit manufacture, involves planarizing spin on glass layer by etching to form new dielectric layer |
摘要 |
A dielectric layer (21) is formed on a dielectric layer (15) covering the voids by grinding the surface of dielectric layer (15). A spin on glass (SOG) layer (23) is formed on the dielectric layer (21). The SOG layer is planarized by etching to form a dielectric layer (24).
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申请公布号 |
DE10130824(A1) |
申请公布日期 |
2002.10.10 |
申请号 |
DE20011030824 |
申请日期 |
2001.06.27 |
申请人 |
PROMOS TECHNOLOGIES, INC. |
发明人 |
HU, CHU-CHUN;WU, HSIAO-CHE |
分类号 |
H01L21/768;(IPC1-7):H01L21/310;H01L21/314 |
主分类号 |
H01L21/768 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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