发明名称 Dielectric layer recovery method for integrated circuit manufacture, involves planarizing spin on glass layer by etching to form new dielectric layer
摘要 A dielectric layer (21) is formed on a dielectric layer (15) covering the voids by grinding the surface of dielectric layer (15). A spin on glass (SOG) layer (23) is formed on the dielectric layer (21). The SOG layer is planarized by etching to form a dielectric layer (24).
申请公布号 DE10130824(A1) 申请公布日期 2002.10.10
申请号 DE20011030824 申请日期 2001.06.27
申请人 PROMOS TECHNOLOGIES, INC. 发明人 HU, CHU-CHUN;WU, HSIAO-CHE
分类号 H01L21/768;(IPC1-7):H01L21/310;H01L21/314 主分类号 H01L21/768
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