发明名称 Apparatus and process of improving atomic layer deposition chamber performance
摘要 An apparatus and process for atomic layer deposition that minimizes mixing of the chemicals and reactive gases is disclosed. The first precursor and second precursor are only mixed with other chemicals and reactive gases when and where desired by installing and monitoring a dispensing fore-line. Also, independent and dedicated chamber outlets, isolation valves, exhaust fore-lines, and exhaust pumps are provided that are activated for the specific gas when needed.
申请公布号 US6461436(B1) 申请公布日期 2002.10.08
申请号 US20010977612 申请日期 2001.10.15
申请人 MICRON TECHNOLOGY, INC. 发明人 CAMPBELL PHILIP H.;KUBISTA DAVID J.
分类号 C23C16/44;C23C16/455;(IPC1-7):C23C16/00 主分类号 C23C16/44
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