发明名称 TRACE DATA EXTRACTING METHOD FOR DEBUG AND PERFORMANCE ANALYSIS
摘要 PROBLEM TO BE SOLVED: To solve a problem in a conventional trace data extracting method that it is impossible to extract the registered data over a long time to analyze conditions of a LSI and a device. SOLUTION: A trace data storing means 8, an address counter 3 and a recording interval counter 4 are mounted, or an OR circuit 2, an AND circuit 21, a reading condition mode flag 6, a reading command flag 61 and the like of event flags 111-114 are mounted as a control means. The control means writes the condition of a group of registers 121-124 and a recording interval counter value on the storing means 8, in detecting the switching-on of any one of the event flags 111-114, and steps the address counter 3, and resets the recording interval counter 4, and the recording interval counter 4 counts up every cycle when the writing does not exist, whereby the conditions of the group of registers 121-124 only in a cycle during the operation is extracted with the recording interval.
申请公布号 JP2002288005(A) 申请公布日期 2002.10.04
申请号 JP20010092974 申请日期 2001.03.28
申请人 NEC CORP 发明人 TAKAYAMA KOICHI
分类号 G06F11/28;G06F11/22 主分类号 G06F11/28
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