| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor testing circuit that can realize a high- speed test for semiconductor device even by using a low-speed testing device. SOLUTION: This semiconductor testing device is provided with a test signal generating means that converts the frequency of a first test signal from the semiconductor testing device at specified times and generates a second test signal, a test signal input means to input the second test signal into a semiconductor circuit to be tested, a frequency reducing means to reduce at specified times an output signal from the semiconductor circuit to be tested that is given the second test signal, and a judging means to judge the output signal from the frequency reducing means.
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