发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT
摘要 A fifth interlayer insulating film is formed on a fourth interlayer insulating film. A third contact hole is formed in such a manner as to pass through the fourth and fifth interlayer insulating films. First and second high melting point metal films are deposited on the inner surface of the third contact hole and the surface of the fifth interlayer insulating film, and then etched-back until the fifth interlayer insulating film is exposed, to form a metal plug. A second interconnection layer is formed on the fifth interlayer insulating film in such a manner as to be conducted to the metal plug. The thickness of the fifth interlayer insulating film is set to be larger than the depth of a recess formed by depressing the upper end surface of the metal plug upon etching-back.
申请公布号 US2002140017(A1) 申请公布日期 2002.10.03
申请号 US19990441784 申请日期 1999.11.17
申请人 TAKATA YOSHIFUMI 发明人 TAKATA YOSHIFUMI
分类号 H01L21/768;H01L21/8242;(IPC1-7):H01L27/108;H01L29/94;H01L31/119;H01L29/76 主分类号 H01L21/768
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