| 摘要 |
<p>A scanning confocal epi-illumination microscope comprising a light source (1), which may be a laser, for supplying a light beam to a light condenser (18), which may be a lens. Condenser (18) focuses the light onto object (20) to be examined so as to illuminate a point observational field on or within the object. Reflected, fluorescent or scattered light from the illuminated point field is collected by condenser (18) and transmitted to detector (34). Scanning means (16,17,21,22,25) causes illuminated point field to move in scanning pattern relative to object (20). The outgoing light passing from light source (1) to condenser (18) and the returning light are transmitted via optical fibres and a light separator to divert the return light to detector (34). <IMAGE></p> |
