发明名称 METHOD AND APPARATUS FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To uniformly and efficiently remove a surface oxide film formed on a copper interconnection or the like, regarding a method and an apparatus the manufacturing a semiconductor device, where a process or a means used to remove an inessential substance adhering to the surface of an electrode or an interconnection using copper as the main material is provided. SOLUTION: The method of manufacturing the semiconductor device is provided with a cleaning process, in which the surface oxide film 6 formed on the copper interconnection 3, is cleaned and a first process, in which the film 6 is substituted into carboxylate and a second process, in which the generated carboxylate is reduced and removed.
申请公布号 JP2002270609(A) 申请公布日期 2002.09.20
申请号 JP20010067615 申请日期 2001.03.09
申请人 FUJITSU LTD 发明人 MATSUKI HIROHISA;MIZUTANI AKIYO;MIYAJIMA MOTOMORI;MIZUKOSHI MASATAKA;WATANABE EIJI
分类号 H01L21/3205;B23K31/02;H01L21/306;H01L21/768;H01L23/52;(IPC1-7):H01L21/320 主分类号 H01L21/3205
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