发明名称 FINE MACHINING DEVICE AND FINE MACHINING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a fine machining device and a fine machining method allowing easy machining even to the interior of a closed region surrounded by a pattern of an insulator and free machining of a more complicated fine pattern in machining a machining pattern transformed into an insulator, on a conductive workpiece. SOLUTION: In this fine machining device or method, wherein voltage is applied between a conductive probe and the conductive workpiece to form the machining pattern transformed into the insulator, on the workpiece, has a machining condition computing means for computing a machining condition on the basis of data from a machining data input means and a machined data storage means, and the workpiece is machined on the basis of the machining condition computed by the machining condition computing means.
申请公布号 JP2002264099(A) 申请公布日期 2002.09.18
申请号 JP20010065431 申请日期 2001.03.08
申请人 CANON INC 发明人 SHITO SHUNICHI;ITSUJI TAKEAKI
分类号 B81C1/00;B82B3/00;G01Q60/24;G01Q60/32;G01Q80/00;(IPC1-7):B82B3/00;G01N13/16 主分类号 B81C1/00
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