发明名称 PROBE CARD AND TEST DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a probe card capable of well maintaining the electric connection to an electric device even in the case where the environment temperature varies. SOLUTION: The probe card is provided with a printed substrate having a plurality of electric fist transmission lines, a probe substrate having a plurality of electric second transmission lines connecting respectively to a plurality of the first transmission lines, arranged facing to the printed substrate and having a secondary thermal expansion coefficient smaller than a primary thermal expansion coefficient and a plurality of first contacts coming into contact with each of electrodes of the electric device.
申请公布号 JP2002267687(A) 申请公布日期 2002.09.18
申请号 JP20010068375 申请日期 2001.03.12
申请人 ADVANTEST CORP 发明人 KUITANI TETSUYA
分类号 G01R31/26;G01R1/06;G01R1/073;G01R31/28;H01L21/66;(IPC1-7):G01R1/073 主分类号 G01R31/26
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