发明名称 Method for fabricating semiconductor device
摘要 An n type InP buried layer 22 with Se or S added in an above 5x1018 cm-3 concentration is formed on an active layer mesa stripe 18 having a surface with an SiO2 film 16 formed on at a peripheral part of the mesa stripe 18 other than the surface with the SiO2 film 16 formed on. Accordingly, the buried layer can be grown without the over growth.
申请公布号 US2002127759(A1) 申请公布日期 2002.09.12
申请号 US20010946686 申请日期 2001.09.06
申请人 FUJITSU QUANTUM DEVICES LIMITED 发明人 WATANABE TAKAYUKI
分类号 H01L31/02;H01L31/0304;H01L31/173;H01L31/18;H01L33/00;H01S5/026;H01S5/227;H01S5/30;H01S5/32;(IPC1-7):H01L21/00 主分类号 H01L31/02
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