发明名称 Probe array for a scanning probe microscope
摘要 <p>The probe array has a multiple of individual probes, which respectively have a probe tip (3a-3p) at one or more beams (4a,4b,4e,4f,5a,5b,5e,5f). The individual probes are arranged in the form of a two dimensional grating. The direction of the beams includes with both directions of the grating (a,b) an angle different from 0 or 180 degrees. The length of the beams (4a,4b,..) is greater than the grating distances of the grating. The beams are arranged at a common carrier structure (1) across distance pieces. The carrier structure is arranged in a plane, parallel to the plane of the beams.</p>
申请公布号 EP0854350(B1) 申请公布日期 2002.09.11
申请号 EP19970122587 申请日期 1997.12.20
申请人 CARL ZEISS;CARL-ZEISS-STIFTUNG, TRADING AS CARL ZEISS 发明人 VOELCKER, MARTIN, DR.
分类号 G01N37/00;G01B5/28;G01B7/34;G01N27/00;G01Q20/02;G01Q60/22;G01Q70/02;G02B;H01J37/00;H01J37/28;(IPC1-7):G01B7/34 主分类号 G01N37/00
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