发明名称 THREE-DIMENSIONAL SHAPE MEASURING DEVICE BY PHASE SHIFT METHOD
摘要 PROBLEM TO BE SOLVED: To provide a three-dimensional shape measuring device capable of measuring the three-dimensional shape of an object surface having a large area highly accurately at high speed by using a phase shift method. SOLUTION: Line illumination 4 having a sine wave-shaped intensity distribution is projected in the axial direction of an inspection object 3 by using an illumination unit 2. The place where the sine wave-shaped line illumination 4 is projected on the inspection object 3 is imaged by using a line sensor camera 1 having pixels arranged in the axial direction of the inspection object 3. The whole surface of the inspection object 3 is imaged by rotating the inspection object 3 by an inspection object driving motor 5, and the three-dimensional shape of the inspection object 3 is measured by the phase shift method.
申请公布号 JP2002257528(A) 申请公布日期 2002.09.11
申请号 JP20010059053 申请日期 2001.03.02
申请人 RICOH CO LTD 发明人 SAKIDA RYUJI;KAMATA TERUMI
分类号 G01B11/25;G01B11/24;G06T1/00;(IPC1-7):G01B11/25 主分类号 G01B11/25
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