发明名称 |
Delay line tap setting override for delay locked loop (DLL) testability |
摘要 |
An integrated circuit having a delay locked loop (DLL) connected to a test circuit. The DLL includes a plurality of taps connected to a plurality of register cells. The test circuit is capable of enabling any register cell to select a tap to test the DLL.
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申请公布号 |
US6448756(B1) |
申请公布日期 |
2002.09.10 |
申请号 |
US20000650552 |
申请日期 |
2000.08.30 |
申请人 |
MICRON TECHNOLOGY, INC. |
发明人 |
LOUGHMILLER DANIEL R. |
分类号 |
H03L7/081;(IPC1-7):H03L7/06 |
主分类号 |
H03L7/081 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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