发明名称 SMALL-SIZED TESTING DEVICE
摘要 <p>PROBLEM TO BE SOLVED: To provide a small-sized testing device having a high pseudo-adiabatic effect. SOLUTION: This small-sized testing device is operated as follows: a heater 13a is driven so that temperature of a main body 13b detected by a second thermometer 50 is made to be equal to a result measured by a first thermometer 30 while temperature of a composting space CS is measured by the first thermometer 30; then the temperature of the composting space CS is made to be approximately equal to the temperature of the main body 13b; further flowing-in/out of the heat between the composing space CS and an outer vessel 13 is not occurred; and finally such a pseudo-adiabatic effect that a reaction vessel 11 is thermally isolated from the surroundings is realized. At this time, it is prevented that the reaction vessel 11 is strongly affected by the surrounding temperature, because an air layer AR acts as a buffer. Namely, excessive flowing-in/out of the heat caused by overshooting and control delay of the heater 13a is appropriately controlled with a suitable time-lag. Therefore, thermal stability of the reaction vessel 11 is increased, and an accuracy of the pseudo-adiabatic effect is more enhanced than ever.</p>
申请公布号 JP2002253201(A) 申请公布日期 2002.09.10
申请号 JP20010053336 申请日期 2001.02.28
申请人 NISSHIN SEIFUN GROUP INC 发明人 DOI MAKOTO;BAN MASAKI;SHIIBA KIWAMU;KOMINE NORIKO;KIMURA TOSHINORI
分类号 C12M1/00;B09B3/00;C05F3/06;C05F11/06;C05F17/02;C12M1/38;(IPC1-7):C12M1/00 主分类号 C12M1/00
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