发明名称 Semiconductor film manufacturing with selective introduction of crystallization promoting material
摘要 A TFT having stable characteristics is obtained by using a crystal silicon film obtained by crystallizing an amorphous silicon film by using nickel. Phosphorus ions are implanted to regions 111 and 112 by using a mask 109. Then, a heat treatment is performed to getter nickel existing in a region 113 to the regions 111 and 112. Then, the mask 109 is side-etched to obtain a pattern 115. Then, the regions 111 and 112 are removed by utilizing the pattern 115 and to pattern the region 113. Thus, a region 116 from which nickel element has been removed is obtained. The TFT is fabricated by using the region 116 as an active layer.
申请公布号 US6448118(B2) 申请公布日期 2002.09.10
申请号 US20000749863 申请日期 2000.12.26
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 YAMAZAKI SHUNPEI;OHTANI HISASHI;OHNUMA HIDETO
分类号 G02F1/136;G02F1/1368;H01L21/20;H01L21/322;H01L21/336;H01L21/77;H01L21/84;H01L29/786;(IPC1-7):H01L21/00;H01L21/26 主分类号 G02F1/136
代理机构 代理人
主权项
地址