发明名称 |
Apparatus and method for testing subscriber loop interface circuits |
摘要 |
A method and apparatus for internally testing portions of a subscriber loop interface circuit. Testing may be conducted on a semiconductor circuit including the subscriber loop interface circuit. The portion of the subscriber loop interface circuit being tested may be the ring trip detector and/or the off-hook detect circuit. Testing may be conducted without disabling the capability of the subscriber loop interface circuit to monitor the hook status of a subscriber.
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申请公布号 |
US2002122538(A1) |
申请公布日期 |
2002.09.05 |
申请号 |
US20020078362 |
申请日期 |
2002.02.21 |
申请人 |
INTERSIL CORPORATION |
发明人 |
LUDEMAN CHRISTOPHER |
分类号 |
H04M3/26;H04M3/00;H04M3/02;H04M3/22;H04M3/30;H04Q3/42;(IPC1-7):H04M1/24;H04M1/00;H04M3/08 |
主分类号 |
H04M3/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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