发明名称 CVD METHOD
摘要 PROBLEM TO BE SOLVED: To provide a CVD method suitable for mass production of oxide films which have superior characteristics and are used mainly for gates. SOLUTION: The CVD method includes a first step of forming a film on a substrate and a second step of stopping the introduction of a material gas and only the excited active species are irradiated to the thin film formed at the first step to facilitate oxidizing reaction.
申请公布号 JP2002246381(A) 申请公布日期 2002.08.30
申请号 JP20010038631 申请日期 2001.02.15
申请人 ANELVA CORP;NEC CORP 发明人 KOU SHIYOUDAI;YUDA KATSUHISA
分类号 G02F1/1368;C23C16/00;C23C16/40;C23C16/44;C23C16/452;C23C16/455;C23C16/56;H01L21/31;H01L21/316;(IPC1-7):H01L21/31;G02F1/136 主分类号 G02F1/1368
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