发明名称 IMAGING SYSTEMS AND PARTICLE DETECTORS USING SILICON ENRICHED BY HEAVIER ELEMENTS
摘要 <p>An imaging and particle detection system using silicon enriched by heavier elements. An element which has been found to be highly effective in these applications is germanium. The silicon material enriched by germanium has an improved absorption coefficient, which is essential for effective particle detection in imaging applications. At low energies, silicon alone absorbs well. At high energies, silicon enriched by germanium has proven effective. Typical applications include medical imaging systems, x-ray imaging systems, non-destructive testing systems, environmental monitoring systems, nuclear imaging systems, fluorescent chemical analysis systems, and x-ray astronomy systems.</p>
申请公布号 WO2002067271(A2) 申请公布日期 2002.08.29
申请号 IL2002000111 申请日期 2002.02.13
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