发明名称 LAYOUT STRUCTURE FOR BIT LINE BOOSTING CAPACITOR OF SEMICONDUCTOR MEMORY DEVICE
摘要 PURPOSE: A layout structure for bit line boosting capacitor of semiconductor memory device is provided to improve the coupling efficiency of a bit line boosting capacitor by including a first insulation transistor, a second insulation transistor, and an MOS(Metal Oxide Semiconductor) transistor in a semiconductor memory device. CONSTITUTION: A memory cell array(100L,100R) includes a first bit line, a second bit line, and a plurality of memory cells connected with the first and the second bit line. A sensing amplification circuit(120) senses an electric potential difference between the first and the second bit line. A first insulation transistor which includes a source region, a drain region and a gate connects/insulates the first bit line with/from the sensing amplification circuit(120). A second insulation transistor which includes a source region, a drain region and a gate connects/insulates the second bit line with/from the sensing amplification circuit(120). An MOS transistor has a source region in common with the first and the second insulation transistor, and includes an uneven-shaped gate.
申请公布号 KR20020068601(A) 申请公布日期 2002.08.28
申请号 KR20010008696 申请日期 2001.02.21
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHOI, JONG HYEON;JU, JAE HUN;KANG, SANG SEOK
分类号 G11C7/18;(IPC1-7):G11C7/18 主分类号 G11C7/18
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