| 摘要 |
The invention relates to a printed circuit board tester, more particularly for testing large-area non-componented circuit boards, comprisinga grid pattern provided with contact points arranged in a predetermined pattern, several contact points in each case being electrically connected to a straight-line scanning channel and an adapter and/or a translator being mounted of said grid pattern,an electronic analyzer electrically connected to said contact points via said scanning channels,a circuit board to be tested to which said adapter and/or said translator may be applied such that said adapter and/or translator produces an electrical contact of said circuit board test points on said circuit board to said contact points of said grid pattern, anda means for electrically connecting at least two scanning channels.
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