发明名称 Grain moisture measuring apparatus and method
摘要 A grain moisture measuring apparatus and method for measuring the moisture content of the grain as the grain moves through a grain conditioning system in which moisture is applied to the grain at a first location. The grain moisture measuring apparatus includes a sample extraction mechanism located at a point downstream from the first location where moisture is applied to the grain. The sample extraction mechanism extracts a sample of grain from the grain moving through the grain conditioning system. A grinding mechanism is connected to the sample extraction mechanism with the grain sample being transferred to the grinding mechanism which then grinds the sample to physically alter the sample. The apparatus further includes a moisture sensor positioned adjacent the grinding mechanism wherein the sample of grain is transferred to a location adjacent the moisture sensor after the grain sample is ground so that the moisture sensor measures the moisture content of the grain sample. Preferably the moisture sensor is a capacitance-type sensor which provides an electronic signal that corresponds to the moisture content of the grain sample. A method is provided for measuring the moisture content of grain as the grain moves through a grain conditioning system in which moisture is applied to the grain at a first location. The method includes the steps of extracting a sample of grain from the grain moving through the grain conditioning system at a point downstream from the first location where moisture is applied to the grain; grinding the sample of grain to physically alter the sample; and measuring the moisture content of the grain sample after the grain sample has been ground.
申请公布号 US6440475(B1) 申请公布日期 2002.08.27
申请号 US19990396801 申请日期 1999.09.14
申请人 SARTEC CORPORATION 发明人 MCNEFF LARRY;RUPP STEVE;WENDORF MATT;CLAFLIN JOEL;MCNEFF CLAYTON;GREUEL PETE;SEDLER LOWELL
分类号 G01N25/56;G01N27/22;G01N33/10;(IPC1-7):A23L1/00;A23N17/00;G01N33/00 主分类号 G01N25/56
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