发明名称 |
SELF DIAGNOSTIC CIRCUIT FOR CONTACT INPUT CIRCUIT |
摘要 |
<p>PROBLEM TO BE SOLVED: To improve the operation rate and reliability by adding a function for detecting degradation of reduction of luminance of a light emitting portion 4a of a photocoupler 4 to a self diagnostic circuit for a contact input 1 using a photocoupler 4 and by enabling change of a board of the contact input circuit 1 before the photocoupler 4 has a failure. SOLUTION: In this self diagnostic circuit for the contact input circuit, a degradation diagnostic energizing circuit 18 (or failure, degradation diagnostic energizing circuit 24) for applying a diagnostic current through a current limiting resistance 20 (26) is provided in parallel with external contacts 3 for carrying diagnostic current to the photocoupler 4 by limiting such that an output of a received light of the degraded photocoupler 4 does not reach an on-decision- level of a detection circuit 12 through the current limiting resistance 20 (26) and degradation of input photocouplers 4 is determined by the outputs of the detection circuits 12.</p> |
申请公布号 |
JP2002237228(A) |
申请公布日期 |
2002.08.23 |
申请号 |
JP20010031001 |
申请日期 |
2001.02.07 |
申请人 |
NISSIN ELECTRIC CO LTD |
发明人 |
TAKANO TAKESHI;HIDA KOSAKU |
分类号 |
H01L31/12;G05B23/02;H01H9/54;(IPC1-7):H01H9/54 |
主分类号 |
H01L31/12 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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