发明名称 |
LIMIT-ULTRAVIOLET LITHOGRAPHY APPARATUS |
摘要 |
PROBLEM TO BE SOLVED: To provide a limit-ultraviolet lithography apparatus for reducing the corrosion effect of ion sputtering. SOLUTION: The limit-ultraviolet lithography apparatus utilizes a thin-film protection coating (46) for protecting a plurality of hardware elements that are positioned near a laser generation light source (32) from the corrosion effect of energy particles emitted from a laser generation light source. |
申请公布号 |
JP2002237448(A) |
申请公布日期 |
2002.08.23 |
申请号 |
JP20010333642 |
申请日期 |
2001.10.31 |
申请人 |
TRW INC |
发明人 |
FORNACA STEVEN W;TALMADGE SAMUEL |
分类号 |
G21K5/00;G03F7/20;H01L21/027;H01S3/094;H05H1/24 |
主分类号 |
G21K5/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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