发明名称 LIMIT-ULTRAVIOLET LITHOGRAPHY APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide a limit-ultraviolet lithography apparatus for reducing the corrosion effect of ion sputtering. SOLUTION: The limit-ultraviolet lithography apparatus utilizes a thin-film protection coating (46) for protecting a plurality of hardware elements that are positioned near a laser generation light source (32) from the corrosion effect of energy particles emitted from a laser generation light source.
申请公布号 JP2002237448(A) 申请公布日期 2002.08.23
申请号 JP20010333642 申请日期 2001.10.31
申请人 TRW INC 发明人 FORNACA STEVEN W;TALMADGE SAMUEL
分类号 G21K5/00;G03F7/20;H01L21/027;H01S3/094;H05H1/24 主分类号 G21K5/00
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