TESTING DEVICE OF SEMICONDUCTOR INTEGRATED CIRCUIT AND TEST METHOD OF SEMICONDUCTOR INTEGRATED CIRCUIT USING DEVICE

摘要

PROBLEM TO BE SOLVED: To execute an improved test with higher precision at higher speed, concerning a testing device of a semiconductor integrated circuit including an A/D conversion circuit or a D/A conversion circuit and a test method of the semiconductor integrated circuit using the device. SOLUTION: A data memory and an analysis part are installed in a test auxiliary device arranged near a test circuit board, and two memory areas are constituted in the data memory, and, while digital test data are stored in one memory area, reading-out for analysis of the digital test data stored beforehand can be executed in the other memory area.