发明名称 FAST PROGRAM, AND FAST SWITCHING METHOD TO VERIFYING PROGRAM
摘要 <p>PROBLEM TO BE SOLVED: To provide a program and a new method for verifying a program. SOLUTION: The threshold voltage of a memory cell is increased by the minimum charge and discharge of bit lines and control gate lines, and successively, the voltage is measured. Also, the capacity between the bit lines and the control gate lines is used to reduce the number of required voltage references. A program current is reduced by using a load device connected to a source diffusion region. Consequently, the band width of a program is increased by a low current consumption of a high voltage charge pump.</p>
申请公布号 JP2002230988(A) 申请公布日期 2002.08.16
申请号 JP20010381765 申请日期 2001.12.14
申请人 HALO LSI DESIGN & DEVICE TECHNOL INC 发明人 OGURA SEIKI;OGURA TOMOKO;OGURA NORI
分类号 G11C16/02;G11C16/04;G11C16/06;G11C16/12;G11C16/34;H01L21/8247;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):G11C16/04;H01L21/824 主分类号 G11C16/02
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