发明名称 |
P-TYPE OHMIC CONTACT OF NITRIDE SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A p-type ohmic contact of a nitride semiconductor device is provided to decrease a driving voltage, by minimizing a voltage drop between a surface of a GaN and a metal electrode while using a Cr/Ti/Au or Cr/Pt/Au material. CONSTITUTION: The nitride semiconductor device has a general structure including an n-type electrode(260) and a p-type electrode(270). The first metal layer, the second metal layer for preventing mutual diffusion between metal materials and the third metal layer for increasing wire bonding efficiency are sequentially stacked to form a structure of a triple metal layer. The structure of the triple metal layer is used as the p-type electrode.
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申请公布号 |
KR20020065948(A) |
申请公布日期 |
2002.08.14 |
申请号 |
KR20010006045 |
申请日期 |
2001.02.08 |
申请人 |
KNOWLEDGE ON INC. |
发明人 |
HWANG, SUN WON;LEE, YEONG JU;SON, SEONG JIN;YANG, JEONG JA |
分类号 |
H01L21/28;(IPC1-7):H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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