发明名称 COMPLEMENTARY-METAL-OXIDE-SEMICONDUCTOR SEMICONDUCTOR DEVICE WITH GERMANIUM-CONTAINING POLYSILICON GATE AND FABRICATING METHOD THEREOF
摘要 PURPOSE: A complementary-metal-oxide-semiconductor(MOS) semiconductor device with a germanium-containing polysilicon gate is provided to efficiently prevent gate impurities from being depleted, by making germanium have different effective density in an NMOS transistor region and a PMOS transistor region without a complicated change of a process. CONSTITUTION: The total quantities of germanium contained in a unit area are the same in a polysilicon gate of a PMOS transistor and a polysilicon gate of an NMOS transistor. The distribution of germanium density in the polysilicon gates measured according to a distance from a gate insulation layer(12) are different. The germanium quantity of the polysilicon gate of the PMOS transistor is higher than that of the NMOS transistor in a portion adjacent to the gate insulation layer.
申请公布号 KR20020066137(A) 申请公布日期 2002.08.14
申请号 KR20010006407 申请日期 2001.02.09
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 BAE, GEUM JONG;CHOI, TAE HUI;KIM, SANG SU;LEE, HWA SEONG;LEE, NAE IN
分类号 H01L29/43;H01L21/28;H01L21/8238;H01L27/092;H01L29/423;H01L29/49;H01L29/78;(IPC1-7):H01L27/092 主分类号 H01L29/43
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