发明名称 |
COMPLEMENTARY-METAL-OXIDE-SEMICONDUCTOR SEMICONDUCTOR DEVICE WITH GERMANIUM-CONTAINING POLYSILICON GATE AND FABRICATING METHOD THEREOF |
摘要 |
PURPOSE: A complementary-metal-oxide-semiconductor(MOS) semiconductor device with a germanium-containing polysilicon gate is provided to efficiently prevent gate impurities from being depleted, by making germanium have different effective density in an NMOS transistor region and a PMOS transistor region without a complicated change of a process. CONSTITUTION: The total quantities of germanium contained in a unit area are the same in a polysilicon gate of a PMOS transistor and a polysilicon gate of an NMOS transistor. The distribution of germanium density in the polysilicon gates measured according to a distance from a gate insulation layer(12) are different. The germanium quantity of the polysilicon gate of the PMOS transistor is higher than that of the NMOS transistor in a portion adjacent to the gate insulation layer.
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申请公布号 |
KR20020066137(A) |
申请公布日期 |
2002.08.14 |
申请号 |
KR20010006407 |
申请日期 |
2001.02.09 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
BAE, GEUM JONG;CHOI, TAE HUI;KIM, SANG SU;LEE, HWA SEONG;LEE, NAE IN |
分类号 |
H01L29/43;H01L21/28;H01L21/8238;H01L27/092;H01L29/423;H01L29/49;H01L29/78;(IPC1-7):H01L27/092 |
主分类号 |
H01L29/43 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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