发明名称 Direct temperature control for a component of a substrate processing chamber
摘要 An apparatus and a method of regulating temperature of a component of a processing chamber is provided. The apparatus comprises a first thermal conductor thermally connected to the component, wherein the first thermal conductor is a resistive heating element disposed adjacent the component, a second thermal conductor thermally connected to the component, wherein the second thermal conductor is a fluid channel disposed adjacent the component, the fluid channel having a fluid inlet and a fluid outlet, a controller connected to the first and second thermal conductors, providing at least one temperature sensor connected to the component to supply temperature readings to the controller. Radiative heaters in thermal communication with the component may be used in place of a resistive heating element.
申请公布号 US6433314(B1) 申请公布日期 2002.08.13
申请号 US20000632721 申请日期 2000.08.04
申请人 APPLIED MATERIALS, INC. 发明人 MANDREKAR TUSHAR;TOLIA ANISH;KHURANA NITIN
分类号 C23C16/42;G05D23/19;H01J37/32;H01L21/00;H01L21/205;(IPC1-7):F27B5/14 主分类号 C23C16/42
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