发明名称 Method and apparatus for detection of electrical overstress
摘要 A circuit that senses changes in the electrical characteristics of one or more circuit elements and generates one or more signals based, at least in part, on the electrical characteristics that are sensed, is incorporated into an integrated circuit. In a further aspect of the present invention, the one or more signals generated by the circuit are indicative of the reliability of an electronic device into which an embodiment of the present invention is incorporated.
申请公布号 US6433616(B1) 申请公布日期 2002.08.13
申请号 US20000670310 申请日期 2000.09.26
申请人 INTEL CORPORATION 发明人 DISHONGH TERRANCE J.;PULLEN DAVID H.
分类号 G01R31/30;H01L27/02;(IPC1-7):H01H37/76 主分类号 G01R31/30
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