| 摘要 |
PROBLEM TO BE SOLVED: To reduce manufacturing and application costs. SOLUTION: A probe board 31 with a probe pin 13 mounted is divided into boards 31a and 31b, and the probe pin 13 is mounted to each of them. Divided cards 32 and 33 are integrated for composing a probe card 34. The number of probe pins to be mounted to one board decreases, the manufacturing yield of each card is improved drastically, and the yield of the entire probe card is improved drastically. Also, maintenance can be made separately for each of them. Further, even if the probe pin of one card is damaged, the other card can be used without any problem.
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