MARKING METHOD FOR INITIAL DEFECTIVE BLOCK, DETECTING METHOD, AND SEMICONDUCTOR MEMORY

摘要

PROBLEM TO BE SOLVED: To provide a control method for a defective block by which a defective block is easily controlled and to provide a semiconductor memory. SOLUTION: A method for marking an initial defective block at the time of shipping semiconductor memories, in which a memory region is divided into a plurality of blocks and which has an ECC function, includes a stage where an initial defective block is detected and an ECC code becoming an ECC error for a specific region of the initial defective block is written.