发明名称 High performance silicon contact for flip chip
摘要 The present invention provides a semiconductive substrate which includes front and back surfaces and a hole which extends through the substrate and between the front and back surfaces. The hole is defined in part by an interior wall portion and forms an outer conductive sheath. Conductive material is formed proximate at least some of the interior wall portion. Subsequently, a layer of dielectric material is formed within the hole, over and radially inwardly of the conductive material. A second conductive material is then formed within the hole over and radially inwardly of the dielectric material layer. The latter conductive material constitutes an inner conductive coaxial line component.
申请公布号 US2002105087(A1) 申请公布日期 2002.08.08
申请号 US20010778913 申请日期 2001.02.08
申请人 FORBES LEONARD;AHN KIE Y. 发明人 FORBES LEONARD;AHN KIE Y.
分类号 H01L23/52;H01L21/3205;H01L21/768;H01L23/12;H01L23/48;H05K1/02;H05K1/11;(IPC1-7):H01L23/48;H01L29/40;H01L23/053;H01L21/476;H01L21/44 主分类号 H01L23/52
代理机构 代理人
主权项
地址