发明名称 Process and device for determining the thickness transverse profile and thickness longitudinal profile of a running strip of material
摘要 A process for the determination of the thickness transverse profile and the thickness longitudinal profile of a running material strip. The process includes (a) determining the strip thicknesses in at least two measuring areas, (b) determining the longitudinal position of the thickness longitudinal profile, (c) measuring the strip thickness in the longitudinal position and setting a correction value to be zero, (d) measuring an adjustment setting (DELTAP) of the measuring unit for the longitudinal position, (e) calculating the gradient (k) of the strip thicknesses transverse to the direction of travel of the strip, (f) recalculating the correction value (DELTAK) from the previous correction values and the product of (k) and (DELTAP), (g) calculating the mean strip thickness (Dm), (h) calculating the corrected strip thickness in the longitudinal position as the sum of (Dm) and (DELTAK), (i) repeating steps (d) to (h) within an adjustment movement cycle and (j) determining the thickness transverse profile from the strip thickness and the thickness longitudinal profile from the mean strip thickness.
申请公布号 US6429944(B1) 申请公布日期 2002.08.06
申请号 US20000688620 申请日期 2000.10.16
申请人 IMS MESSSYSTEME GMBH 发明人 FLORMANN PAUL
分类号 B21C51/00;G01B15/02;G01B21/08;(IPC1-7):G01B11/06 主分类号 B21C51/00
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