发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device in which ooze-out of solder due to thermal stress and malfunction caused by ooze-out of solder are suppressed. SOLUTION: The semiconductor device comprises a semiconductor chip 1, an interposer electrode 3 being connected with the semiconductor chip 1 through solder bumps 2, and an interposer substrate 4 having external terminals wherein these semiconductor chip 1 and interposer electrode 3 are resin sealed on the interposer substrate 4 and the interposer electrode 3 is provided with vacant holes 11.
申请公布号 JP2002217329(A) 申请公布日期 2002.08.02
申请号 JP20010013045 申请日期 2001.01.22
申请人 MITSUBISHI ELECTRIC CORP 发明人 SHINOHARA TATSURO;TAMURA TAKUMA
分类号 H01L23/12;(IPC1-7):H01L23/12 主分类号 H01L23/12
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