发明名称 SEMICONDUCTOR STORAGE DEVICE
摘要 PROBLEM TO BE SOLVED: To reduce the area of a full CMOS cell. SOLUTION: A memory cell for an SRAM has a full CMOS cell structure in which three different conductivity type wells are arranged successively. Further, the cell has a first and second contact holes extended on the impurity region of a fixed MOS transistor form the upper sections of the first and second gates 3 and 4, and formed in a self-alignment manner to the first and second gates 3 and 4, and the first and second local wirings 7 and 8 formed in the contact holes.
申请公布号 JP2002217316(A) 申请公布日期 2002.08.02
申请号 JP20010007491 申请日期 2001.01.16
申请人 MITSUBISHI ELECTRIC CORP 发明人 OBAYASHI SHIGEKI
分类号 H01L21/768;H01L21/8244;H01L27/10;H01L27/105;H01L27/11;H01L27/12 主分类号 H01L21/768
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