发明名称 CHEMICAL MECHANICAL POLISHING OF COPPER-OXIDE DAMASCENE STRUCTURES
摘要 A method of chemical mechanical polishing of a metal damascene structure which includes an insulation layer having trenches on a wafer and a metal layer having a lower portion located in trenches of the insulation layer and an upper portion overlying the lower portion and the insulation layer is provided. The method comprises a first step of planarizing the upper portion of the metal layer and a second step of polishing the insulation layer and the lower portion of the metal layer. In the first step of planarizing the upper portion of the metal layer, the wafer and a polishing pad in urged at an applied pressure p and a relative velocity v in a contact mode between the wafer and the polishing pad to promote an increased metal removal rate. In the second, the insulation layer and the lower portion of the metal layer are polished in a steady-state mode to form individual metal lines in the trenches with minimal dishing of the metal lines and overpolishing of the insulation layer.
申请公布号 WO02059943(A2) 申请公布日期 2002.08.01
申请号 WO2002US02254 申请日期 2002.01.23
申请人 ASML US, INC.;MASSACHUSETTS INSTITUTE OF TECHNOLOGY;SAKA, NANNAJI;LAI, JIUN-YU;OH, HILARIO, L. 发明人 SAKA, NANNAJI;LAI, JIUN-YU;OH, HILARIO, L.
分类号 B24B37/04;B24B49/16;H01L21/304;H01L21/3205;H01L21/321 主分类号 B24B37/04
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