发明名称 METHOD FOR MANUFACTURING SURFACE ACOUSTIC WAVE DEVICE AND INSPECTING INSTRUMENT
摘要 An instrument for inspecting a surface acoustic wave device used as a high frequency filter in the field of mobile communication. The instrument comprises an electron gun (1) for generating and projecting an electron beam as primary electrons a condenser lens (2) for focusing the electron beam on a substrate (9) a secondary electron detector (4) for detecting secondary electrons emitted from the substrate (9) irradiated with the primary electrons a substrate holder (5) for holding the substrate (9), and a conductive grounding mechanism (6) earthed and capable of contacting with a metal film (7). The grounding mechanism (6) includes a conductive contact portion (12) capable of contacting with the metal film (7), an arm portion (47) with the contact portion (12) on its one end, and a rotary shaft (48) mounted on the end of the arm portion (47) and opposed to the contact portion (12). The substrate (9) has a two-layer structure including a circular piezoelectric substrate (8) made of lithium tantalate (LiTaO3) and the metal film (7) formed of aluminum (Al) on the piezoelectric substrate (8).
申请公布号 WO02060054(A1) 申请公布日期 2002.08.01
申请号 WO2001JP08639 申请日期 2001.10.01
申请人 KABUSHIKI KAISHA TOSHIBA;TAKAGI, TOSHIYUKI 发明人 TAKAGI, TOSHIYUKI
分类号 H03H3/08;(IPC1-7):H03H3/08;H01L21/027 主分类号 H03H3/08
代理机构 代理人
主权项
地址