发明名称 Metal-to-metal antifuse structure and fabrication method
摘要 A metal-to-metal antifuse according to the present invention is compatible with a Cu dual damascene process and is formed over a lower Cu metal layer planarized with the top surface of a lower insulating layer. A lower barrier layer is disposed over the lower Cu metal layer. An antifuse material layer is disposed over the lower barrier layer. An upper barrier layer is disposed over the antifuse material layer. An upper insulating layer is disposed over the upper barrier layer. An upper Cu metal layer is planarized with the top surface of the upper insulating layer and extends therethrough to make electrical contact with the upper barrier layer.
申请公布号 US2002100907(A1) 申请公布日期 2002.08.01
申请号 US20000737642 申请日期 2000.12.14
申请人 ACTEL CORPORATION 发明人 WANG DANIEL C.
分类号 H01L23/52;H01L21/3205;H01L21/82;H01L23/525;H01L23/532;(IPC1-7):H01L29/04 主分类号 H01L23/52
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