发明名称 PROCESS FOR ETCHING BURIED CAVITIES WITHIN SILICON WAFERS
摘要 <p>A silicon element having macrocavities (60) beneath its exterior surface (12) is fabricated by electrochemical etching of a p-tpye silicon wafer (10). Etching at a high current density results in the formation of deep macrocavities overhung by a layer of crystalline silicon. The process works with both aqueous and non-aqueous electrolytes.</p>
申请公布号 WO2002059937(A2) 申请公布日期 2002.08.01
申请号 US2001045573 申请日期 2001.10.24
申请人 发明人
分类号 主分类号
代理机构 代理人
主权项
地址