发明名称 |
JIG FOR MEASURING HIGH-TEMPERATURE CHARACTERISTICS OF AXIAL-LEAD-TYPE ELECTRONIC COMPONENT |
摘要 |
PROBLEM TO BE SOLVED: To provide a jig for measuring the high-temperature characteristics of axial-lead-type electronic components capable of efficiently and highly accurately measuring the high-temperature characteristics of the axial-lead-type electronic components. SOLUTION: A shape memory alloy 1 in which a curved shape is stored is arranged in such a way as to cover an outer circumferential part of the axial-lead-type diode (electronic component) 4 when heated to a predetermined temperature. A hot plate 2 with a heating function provided with grooves 3 hollowed out in the same semicylindrical shape as that of the outer circumferential part of the axial-lead-type diode 4 is used to measure the high-temperature characteristics of the diode 4.
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申请公布号 |
JP2002214282(A) |
申请公布日期 |
2002.07.31 |
申请号 |
JP20010006150 |
申请日期 |
2001.01.15 |
申请人 |
CANON INC |
发明人 |
TAKAHASHI MASAYUKI |
分类号 |
G01R31/26;(IPC1-7):G01R31/26 |
主分类号 |
G01R31/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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