发明名称 JIG FOR MEASURING HIGH-TEMPERATURE CHARACTERISTICS OF AXIAL-LEAD-TYPE ELECTRONIC COMPONENT
摘要 PROBLEM TO BE SOLVED: To provide a jig for measuring the high-temperature characteristics of axial-lead-type electronic components capable of efficiently and highly accurately measuring the high-temperature characteristics of the axial-lead-type electronic components. SOLUTION: A shape memory alloy 1 in which a curved shape is stored is arranged in such a way as to cover an outer circumferential part of the axial-lead-type diode (electronic component) 4 when heated to a predetermined temperature. A hot plate 2 with a heating function provided with grooves 3 hollowed out in the same semicylindrical shape as that of the outer circumferential part of the axial-lead-type diode 4 is used to measure the high-temperature characteristics of the diode 4.
申请公布号 JP2002214282(A) 申请公布日期 2002.07.31
申请号 JP20010006150 申请日期 2001.01.15
申请人 CANON INC 发明人 TAKAHASHI MASAYUKI
分类号 G01R31/26;(IPC1-7):G01R31/26 主分类号 G01R31/26
代理机构 代理人
主权项
地址